NASCENT2-R-Database.jpg
![](https://erc-assoc.org/sites/default/files/styles/page_width/public/NASCENT2-R-Database.jpg?itok=v-s7Ll7n)
(a) Critical dimensions (CDs) characterizing hourglass patterns. (b) RGB image of a wafer sample with hourglass patterns captured by a hyperspectral imaging system. (c) A 70-degree SEM picture from cross section of the area of the hourglass wafer sample specified with red rectangle in (b). (d) A right-angle SEM picture from cross section of the area specified with red rectangle in (b).
Credit:
NASCENT